A fully programmable, 2-Channel USB interface that unlocks new levels of customisable, hands-free actions and commands. Consisting of a hardware plug-and-play module, the SYSTEM 8 SmartSwitch provides up to 4 switch inputs. Designed to operate exclusively with ABI’s software and test equipment.
A versatile learning tool for the SYSTEM 8 range. It’s flexibility teaches operators the many uses of the AMS, ATM, BFL, AICT and MIS modules, giving a variety of programmable circuit conditions to be tested. An essential accessory for gaining a deeper understanding and maximising the benefits of our equipment.
Make probing DIL and SMT discrete devices effortless. Spring mounted pins ensure good contact on even the smallest, hard to reach components.
A unique solution for probing surface-mount components that ensures good device contact to guarantee valid results.
Multiprobes are an ideal option when it’s difficult to gain access to an IC or connector. With a single hand, it is possible to capture up to 8 or 10 pins.
For more advanced applications, ABI offers a range of cable assemblies covering various sizes of PLCC connectors.
For testing digital ICs in SOIC packages, ABI offers a cable assembly and clip set for the SYSTEM 8 BFL and ATM modules.
For testing analogue ICs with SOIC packages, ABI offers a cable assembly and clip set which covers most standard packages available.
Complete coverage of standard DIL packages. Robust and long lasting, they are an essential addition to the ATM, BFL, AICT and AMS modules.
0.3″ gauge DIL test clip set consisting of 8, 14, 16, 20, 22 and 24 pin test clips,
Part No. 660328
Two handsfree SQ10 probes (positive and negative) with banana cables intended for connection directly to a multimeter or power supply.
Test a wide range of SOIC and PLCC devices of different sizes with Push-Pop (P/P) or Clam-Shell (C/S) options.
For more advanced applications, ABI offers a range of cable asssemblies covering various sizes of QFP connectors.